Inventors:
Stephen A. Muller - Santa Clara CA, US
Xiao-Ding Cai - Fremont CA, US
Agustin Del Alamo - San Diego CA, US
James M. Frei - Sunol CA, US
Assignee:
Oracle America, Inc. - Redwood City CA
International Classification:
G01N 37/00
Abstract:
Method and system that test device sensitivity according to whether the device passes or fails when subjected to a test signal. The device may be repeatedly subjected to test signal at varying operating parameters in order to assess pass-fail threshold at which the device transitions from operating properly/improperly to operating improperly/properly.