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Dong Li Phones & Addresses

  • 600 Telford Ave, S San Fran, CA 94080 (415) 816-8051
  • South San Francisco, CA
  • San Carlos, CA
  • 1331 Stockton St, San Francisco, CA 94133 (415) 640-3133

Professional Records

Medicine Doctors

Dong Li Photo 1

Dong M Li, El Cerrito CA - LAC

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Specialties:
Acupuncture
Address:
11740 San Pablo Ave Suite A, El Cerrito, CA 94530
(510) 237-1680 (Phone), (510) 237-1619 (Fax)
Languages:
English
Dong Li Photo 2

Dong Mei Li, El Cerrito CA

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Specialties:
Acupuncturist
Address:
11740 San Pablo Ave, El Cerrito, CA 94530

License Records

Dong Ming Li

License #:
="26530" - Active
Issued Date:
May 28, 2008
Renew Date:
Dec 1, 2015
Expiration Date:
Nov 30, 2017
Type:
Certified Public Accountant

Real Estate Brokers

Dong Li Photo 3

Dong Li, Burlingame CA

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Specialties:
Purchase Loan
Refinancing
Home Equity
Work:
bankers preferred mortgage inc
1819 Trousdale Blvd, Burlingame, CA 94010
(650) 227-1018 (Office)

Business Records

Name / Title
Company / Classification
Phones & Addresses
Dong Li
Director
Trunkbow International Holdings Limited
Dong Li
President
US NEW TECH GRAIN GROUP, INC
Dong Li
President
TOUCHWRITE, INC
Business Services at Non-Commercial Site · Services-Misc
10112 Imerial Ave, Cupertino, CA 95014
10112 Imperial Ave, Cupertino, CA 95014
Dong Jin Li
Activebargains LLC
On Line Service
81 Belmont Dr, Daly City, CA 94015

Publications

Isbn (Books And Publications)

Beginner's Chinese Dictionary

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Author

Dong Li

ISBN #

0804835519

Tuttle Learner's Chinese English Dictionary

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Author

Dong Li

ISBN #

0804835527

Us Patents

Method For High Aspect Ratio Hdp Cvd Gapfill

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US Patent:
6812153, Nov 2, 2004
Filed:
Apr 30, 2002
Appl. No.:
10/137132
Inventors:
Zhong Qiang Hua - Saratoga CA
Dong Qing Li - Santa Clara CA
Zhengquan Tan - Cupertino CA
Zhuang Li - San Jose CA
Michael Chiu Kwan - Redwood City CA
Bruno Geoffrion - San Jose CA
Padmanabhan Krishnaraj - San Francisco CA
Assignee:
Applied Materials Inc. - Santa Clara CA
International Classification:
H01L 21302
US Classification:
438706, 438710, 438712, 427569
Abstract:
A method of depositing a high density plasma silicon oxide layer having improved gapfill capabilities. In one embodiment the method includes flowing a process gas consisting of a silicon-containing source, an oxygen-containing source and helium into a substrate processing chamber and forming a plasma from the process gas. The ratio of the flow rate of the helium with respect to the combined flow rate of the silicon source and oxygen source is between 0. 5:1 and 3. 0:1 inclusive. In one particular embodiment, the process gas consists of monosilane (SiH ), molecular oxygen (O ) and helium.

Method For High Aspect Ratio Hdp Cvd Gapfill

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US Patent:
7064077, Jun 20, 2006
Filed:
Oct 1, 2004
Appl. No.:
10/956469
Inventors:
Zhong Qiang Hua - Saratoga CA, US
Dong Qing Li - Santa Clara CA, US
Zhengquan Tan - Cupertino CA, US
Zhuang Li - San Jose CA, US
Michael Chiu Kwan - Redwood City CA, US
Bruno Geoffrion - San Jose CA, US
Padmanabhan Krishnaraj - San Francisco CA, US
Assignee:
Applied Materials - Santa Clara CA
International Classification:
H01L 21/302
US Classification:
438715, 438706, 438714, 427569
Abstract:
A method of depositing a high density plasma silicon oxide layer having improved gapfill capabilities. In one embodiment the method includes flowing a process gas consisting of a silicon-containing source, an oxygen-containing source and helium into a substrate processing chamber and forming a plasma from the process gas. The ratio of the flow rate of the helium with respect to the combined flow rate of the silicon source and oxygen source is between 0. 5:1 and 3. 0:1 inclusive. In one particular embodiment, the process gas consists of monosilane (SiH), molecular oxygen (O) and helium.

Hdp-Cvd Multistep Gapfill Process

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US Patent:
7205240, Apr 17, 2007
Filed:
Jun 4, 2003
Appl. No.:
10/456611
Inventors:
M. Ziaul Karim - San Jose CA, US
Bikram Kapoor - Santa Clara CA, US
Anchuan Wang - Fremont CA, US
Dong Qing Li - Santa Clara CA, US
Katsunari Ozeki - Chiba, JP
Manoj Vellaikal - Santa Clara CA, US
Zhuang Li - San Jose CA, US
Assignee:
Applied Materials, Inc. - Santa Clara CA
International Classification:
C23C 16/00
US Classification:
438694, 438695, 438692, 438424, 438435, 42725523, 42725528, 42725537, 216 59, 216 67, 216 79, 15634524, 15634533, 15634548, 118696, 118697, 118723 I, 118723 IR
Abstract:
A gapfill process is provided using cycling of HDP-CVD deposition, etching, and deposition step. The fluent gas during the first deposition step includes an inert gas such as He, but includes Hduring the remainder deposition step. The higher average molecular weight of the fluent gas during the first deposition step provides some cusping over structures that define the gap to protect them during the etching step. The lower average molecular weight of the fluent gas during the remainder deposition step has reduced sputtering characteristics and is effective at filling the remainder of the gap.

Thin-Film Magnetic Head Having A Write Shield Layer

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US Patent:
7440229, Oct 21, 2008
Filed:
Aug 6, 2004
Appl. No.:
10/912245
Inventors:
Yoshitaka Sasaki - Santa Clara CA, US
Lijie Guan - Milpitas CA, US
Hiroyuki Ito - Sunnyvale CA, US
Dong Hong Li - Fremont CA, US
Assignee:
Headway Technologies, Inc. - Milpitas CA
International Classification:
G11B 5/127
US Classification:
36012522
Abstract:
A thin-film magnetic head has a laminated construction comprising a main pole layer having a magnetic pole tip on a side of the medium-opposing surface opposing a recording medium, a write shield layer opposing the magnetic pole tip forming a recording gap layer, on the side of the medium-opposing surface, and a thin-film coil wound around at least a portion of the write shield layer. The thin-film magnetic head has an upper yoke pole layer having a larger size than the portion of the main pole layer which is more distant from the medium-opposing surface than the recording gap layer, wherein the upper yoke pole layer is joined to the side of the main pole layer which is near the thin-film coil.

Image Feature Identification And Motion Compensation Apparatus, Systems, And Methods

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US Patent:
7542614, Jun 2, 2009
Filed:
Jun 6, 2007
Appl. No.:
11/758910
Inventors:
Amnon Silverstein - Mountain View CA, US
Sheng Lin - Sunnyvale CA, US
Dong Li - Cupertino CA, US
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
G06K 9/36
US Classification:
382232
Abstract:
Apparatus, systems, and methods disclosed herein may estimate the magnitude of relative motion between a scene and an image capture device used to capture the scene. Some embodiments may utilize discrete cosine transform and/or Sobel gradient techniques to identify one or more blocks of pixels in an originating calibration image frame. Matching blocks of pixels may be located in a successive calibration image frame. Motion vectors originating at one calibration frame and terminating at the other calibration frame may be calculated. The magnitude of relative motion derived thereby may be used to adjust image capture parameters associated with the image capture device, including exposure settings.

Image Feature Identification And Motion Compensation Apparatus, Systems, And Methods

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US Patent:
7599566, Oct 6, 2009
Filed:
Jun 6, 2007
Appl. No.:
11/758815
Inventors:
Amnon Silverstein - Mountain View CA, US
Sheng Lin - Sunnyvale CA, US
Dong Li - Cupertino CA, US
Assignee:
Aptina Imaging Corporation - George Town
International Classification:
G06K 9/36
US Classification:
382238
Abstract:
Apparatus, systems, and methods disclosed herein may estimate the magnitude of relative motion between a scene and an image capture device used to capture the scene. Some embodiments may utilize discrete cosine transform and/or Sobel gradient techniques to identify one or more blocks of pixels in an originating calibration image frame. Matching blocks of pixels may be located in a successive calibration image frame. Motion vectors originating at one calibration frame and terminating at the other calibration frame may be calculated. The magnitude of relative motion derived thereby may be used to adjust image capture parameters associated with the image capture device, including exposure settings.

Thin-Film Magnetic Head, Method Of Manufacturing The Same, Head Gimbal Assembly, And Hard Disk Drive

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US Patent:
7718218, May 18, 2010
Filed:
Sep 10, 2008
Appl. No.:
12/232065
Inventors:
Yoshitaka Sasaki - Santa Clara CA, US
Lijie Guan - Milpitas CA, US
Hiroyuki Ito - Sunnyvale CA, US
Dong Hong Li - Fremont CA, US
Assignee:
Headway Technologies, Inc. - Milpitas CA
International Classification:
G11B 5/127
G11B 5/17
G11B 5/187
US Classification:
427130, 427355, 4273722, 427402
Abstract:
A thin-film magnetic head has a laminated construction comprising a main pole layer having a magnetic pole tip on a side of the medium-opposing surface opposing a recording medium, a write shield layer opposing the magnetic pole tip forming a recording gap layer, on the side of the medium-opposing surface, and a thin-film coil wound around at least a portion of the write shield layer. The thin-film magnetic head has an upper yoke pole layer having a larger size than the portion of the main pole layer which is more distant from the medium-opposing surface than the recording gap layer, wherein the upper yoke pole layer is joined to the side of the main pole layer which is near the thin-film coil.

Image Feature Identification And Motion Compensation Apparatus, Systems, And Methods

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US Patent:
7924316, Apr 12, 2011
Filed:
Mar 14, 2007
Appl. No.:
11/717954
Inventors:
Amnon Silverstein - Mountain View CA, US
Sheng Lin - Sunnyvale CA, US
Dong Li - Cupertino CA, US
Assignee:
Aptina Imaging Corporation - George Town
International Classification:
H04N 5/228
US Classification:
3482084
Abstract:
Apparatus, systems, and methods disclosed herein may estimate the magnitude of relative motion between a scene and an image capture device used to capture the scene. Some embodiments may utilize discrete cosine transform and/or Sobel gradient techniques to identify one or more blocks of pixels in an originating calibration image frame. Matching blocks of pixels may be located in a successive calibration image frame. Motion vectors originating at one calibration frame and terminating at the other calibration frame may be calculated. The magnitude of relative motion derived thereby may be used to adjust image capture parameters associated with the image capture device, including exposure settings.
Dong Hua Li from South San Francisco, CA, age ~59 Get Report